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Exciton diffusion length and concentration of holes in MEH-PPV polymer using the surface voltage and surface photovoltage methods

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dc.title Exciton diffusion length and concentration of holes in MEH-PPV polymer using the surface voltage and surface photovoltage methods en
dc.contributor.author Toušek, Jiří
dc.contributor.author Toušková, Jana
dc.contributor.author Remeš, Zdeněk
dc.contributor.author Čermák, Jan
dc.contributor.author Kousal, Jaroslav
dc.contributor.author Kindl, Dobroslav
dc.contributor.author Kuřitka, Ivo
dc.relation.ispartof Chemical Physics Letters
dc.identifier.issn 0009-2614 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2012
utb.relation.volume 552
dc.citation.spage 49
dc.citation.epage 52
dc.type article
dc.language.iso en
dc.publisher Elsevier en
dc.identifier.doi 10.1016/j.cplett.2012.09.052
dc.relation.uri https://www.sciencedirect.com/science/article/pii/S0009261412011116
dc.description.abstract Novelized method of the surface photovoltage (SPV) measurement convenient for evaluation of exciton diffusion length and thickness of the space charge region (SCR) in organic semiconductors is applied to poly[2-methoxy-5-(2′- ethyl-hexyloxy)-p-phenylene vinylene] (MEH-PPV) polymer. Exciton diffusion length and thickness of the SCR was found. The experiment is complemented by measurements of surface potential by the Kelvin probe force microscopy yielding the work function and concentration of free holes. The latter value is much lower than the concentration of ionized states determined from the thickness of the space charge region, which can be ascribed to the presence of traps. © 2012 Elsevier B.V. All rights reserved. en
utb.faculty Faculty of Technology
utb.faculty University Institute
dc.identifier.uri http://hdl.handle.net/10563/1003026
utb.identifier.rivid RIV/70883521:28110/12:43868136!RIV13-MSM-28110___
utb.identifier.rivid RIV/70883521:28610/12:43868136!RIV13-MSM-28610___
utb.identifier.obdid 43868229
utb.identifier.scopus 2-s2.0-84868215532
utb.identifier.wok 000310567800008
utb.identifier.coden CHPLB
utb.source j-scopus
dc.date.accessioned 2012-11-12T19:34:28Z
dc.date.available 2012-11-12T19:34:28Z
utb.ou Centre of Polymer Systems
utb.contributor.internalauthor Kuřitka, Ivo
utb.fulltext.affiliation J. Toušek a,*, J. Toušková a, Z. Remeš b, J. Čermák b, J. Kousal a, D. Kindl b, I. Kuřitka c a Charles University in Prague, Faculty of Mathematics and Physics, V Holešovičkách 2, 180 00 Prague, Czech Republic b Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague 6, Czech Republic c Tomáš Baťa University in Zlín, Faculty of Technology, 762 72 Zlín, Czech Republic *Corresponding author. | E-mail address: jiri.tousek@mff.cuni.cz (J. Toušek).
utb.fulltext.dates Received 27 August 2012 In final form 23 September 2012 Available online 1 October 2012
utb.fulltext.sponsorship We acknowledge the support of the Grant Agency of the Czech Republic P108/12/G108.
utb.fulltext.projects P108/12/G108
utb.fulltext.faculty Faculty of Technology
utb.fulltext.ou -
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