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Nano-steganography using atomic force microscopy

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dc.title Nano-steganography using atomic force microscopy en
dc.contributor.author Kudělka, Josef
dc.contributor.author Martínek, Tomáš
dc.contributor.author Navrátil, Milan
dc.contributor.author Křesálek, Vojtěch
dc.relation.ispartof 16th International Conference on Nanotechnology - IEEE NANO 2016
dc.identifier.isbn 9781509039142
dc.date.issued 2016
dc.citation.spage 157
dc.citation.epage 159
dc.event.title 16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
dc.event.location Sendai
utb.event.state-en Japan
utb.event.state-cs Japonsko
dc.event.sdate 2016-08-22
dc.event.edate 2016-08-25
dc.type conferenceObject
dc.language.iso en
dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
dc.identifier.doi 10.1109/NANO.2016.7751451
dc.relation.uri http://ieeexplore.ieee.org/document/7751451/
dc.description.abstract This paper presents physical nano-steganography for secret data transmission. The experimental code was engraved into the base polycarbonate plastic layer of a compact disc by atomic force microscopy nanolithography. The advantage is that such information cannot be found using optical microscopes and it is very problematic to find it even by the most of electron microscopes due to the subtle variations in height. © 2016 IEEE. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1006958
utb.identifier.obdid 43875779
utb.identifier.scopus 2-s2.0-85006919162
utb.identifier.wok 000391840000045
utb.source d-scopus
dc.date.accessioned 2017-07-13T14:50:26Z
dc.date.available 2017-07-13T14:50:26Z
dc.description.sponsorship Ministry of Education; Youth and Sports of the Czech Republic within the National Sustainability Programme [LO1303, MSMT-7778/2014]
utb.contributor.internalauthor Kudělka, Josef
utb.contributor.internalauthor Martínek, Tomáš
utb.contributor.internalauthor Navrátil, Milan
utb.contributor.internalauthor Křesálek, Vojtěch
utb.fulltext.affiliation Josef Kudelka, Tomas Martinek, Milan Navratil, Vojtech Kresalek All authors are with Department of Electronics and Measurement Faculty of Applied Informatics, Tomas Bata University in Zlin. Nad Stranemi 4511, 760 05 Zlin, Czech Republic (corresponding author's e-mail: kudelka@fai.utb.cz).
utb.fulltext.dates -
utb.fulltext.sponsorship This work was supported by the Ministry of Education, Youth and Sports of the Czech Republic within the National Sustainability Programme project No. LO1303 (MSMT-7778/2014).
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