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Kelvin probe force microscopy and calculation of charge transport in a graphene/silicon dioxide system at different relative humidity

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Citace článku v časopise:
KONEČNÝ, Martin, Miroslav BARTOŠÍK, Jindřich MACH, Vojtěch ŠVARC, David NEZVAL, Jakub PIASTEK, Pavel PROCHÁZKA, Aleš CAHLÍK a Tomáš ŠIKOLA. Kelvin probe force microscopy and calculation of charge transport in a graphene/silicon dioxide system at different relative humidity. ACS Applied Materials and Interfaces [online]. 2018, vol. 10, iss. 14, s. 11987-11994. [cit. 2020-11-29]. ISSN 1944-8244. Dostupné z: https://pubs.acs.org/doi/abs/10.1021/acsami.7b18041.

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