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Immunity of electronic devices against radio-frequency electromagnetic fields

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dc.title Immunity of electronic devices against radio-frequency electromagnetic fields en
dc.contributor.author Urbančoková, Hana
dc.contributor.author Kovář, Stanislav
dc.contributor.author Halaška, Ondřej
dc.contributor.author Valouch, Jan
dc.relation.ispartof MATEC Web of Conferences
dc.identifier.issn 2261-236X Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2017
utb.relation.volume 125
dc.event.title 21st International Conference on Circuits, Systems, Communications and Computers, CSCC 2017
dc.event.location Crete Island
utb.event.state-en Greece
utb.event.state-cs Řecko
dc.event.sdate 2017-07-14
dc.event.edate 2017-07-17
dc.type conferenceObject
dc.language.iso en
dc.publisher EDP Sciences
dc.identifier.doi 10.1051/matecconf/201712502039
dc.relation.uri https://www.matec-conferences.org/articles/matecconf/abs/2017/39/matecconf_cscc2017_02039/matecconf_cscc2017_02039.html
dc.description.abstract One of the major types of electromagnetic interference, which affect electronic devices in their normal operation, is the interference with radio-frequency electromagnetic fields. This interference is generated by the mainly radio and television transmitters, industrial equipment and other transmitters and receivers in general use for communication. Testing of electromagnetic susceptibility of electronic devices on radiated radio-frequency electromagnetic field is governed by the basic standard IEC 61000-4-3 and the equipment under test are exposed to test electromagnetic fields with an intensity from 1 V/m to 30 V/m, the most often in the frequency range from 80 MHz to 2 GHz. The aim of this paper is to explain the issue of electromagnetic susceptibility and to present sample the electromagnetic immunity tests of the basic set of the intrusion and hold-up alarm system against the radio-frequency electromagnetic field according to the relevant electromagnetic compatibility standards. © The Authors, published by EDP Sciences, 2017. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1007646
utb.identifier.obdid 43877255
utb.identifier.scopus 2-s2.0-85032878892
utb.source d-scopus
dc.date.accessioned 2018-01-15T16:31:36Z
dc.date.available 2018-01-15T16:31:36Z
dc.rights Attribution 4.0 International
dc.rights.uri http://creativecommons.org/licenses/by/4.0/
dc.rights.access openAccess
utb.contributor.internalauthor Urbančoková, Hana
utb.contributor.internalauthor Kovář, Stanislav
utb.contributor.internalauthor Halaška, Ondřej
utb.contributor.internalauthor Valouch, Jan
utb.scopus.affiliation Faculty of Applied Informatics, Tomas Bata University in Zlin, nam. T.G.Masaryka 5555, Zlin, Czech Republic
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Attribution 4.0 International Except where otherwise noted, this item's license is described as Attribution 4.0 International