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Paper no P31: Optoelectronic properties of MEH-PPV thin films influenced by their thickness

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Title: Paper no P31: Optoelectronic properties of MEH-PPV thin films influenced by their thickness
Author: Urbánek, Pavel; Kuřitka, Ivo; Krčmář, Petr; Mašlík, Jan
Document type: Conference paper (English)
Source document: Digest of Technical Papers - SID International Symposium. 2013, vol. 44, p. 105-107
ISSN: 0097-966X (Sherpa/RoMEO, JCR)
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ISBN: 978-1-5108-1531-5
DOI: https://doi.org/10.1002/sdtp.32
Abstract: In this paper, the influence of thickness on the optoelectricul properties of poly(2-metho.xy-5-(2'-ethyl-hexoxy)-1,4-phenyle-ne-vinylene) is discussed. The main goal of our measurements was to describe the relationship between thickness of films and their optoelecirical properties. We discovered that there is always certain minimum film thickness needed for development of conformational structure and for changes in optoelectricul behavior. © (2013) by SID-the Society for Information Display All rights reserved.
Full text: http://onlinelibrary.wiley.com/doi/10.1002/sdtp.32/full
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Citace článku v konferenčním sborníku:
URBÁNEK, Pavel, Ivo KUŘITKA, Petr KRČMÁŘ a Jan MAŠLÍK. Paper no P31: Optoelectronic properties of MEH-PPV thin films influenced by their thickness. In: Digest of Technical Papers - SID International Symposium [online]. London: Blackwell Science, Ltd., 2013, s. 105-107. [cit. 2024-04-26]. ISSN 0097-966X. Dostupné z: http://onlinelibrary.wiley.com/doi/10.1002/sdtp.32/full.

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