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Nanohardness of electron beam irradiated polyamide 11

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dc.title Nanohardness of electron beam irradiated polyamide 11 en
dc.contributor.author Krátký, Petr
dc.contributor.author Maňas, David
dc.contributor.author Maňas, Miroslav
dc.contributor.author Staněk, Michal
dc.contributor.author Ovsík, Martin
dc.contributor.author Kyas, Kamil
dc.contributor.author Řezníček, Martin
dc.relation.ispartof International Journal of Mechanics
dc.identifier.issn 1998-4448 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2014
utb.relation.volume 8
utb.relation.issue 1
dc.citation.spage 37
dc.citation.epage 44
dc.type article
dc.language.iso en
dc.publisher North Atlantic University Union (NAUN)
dc.relation.uri http://www.naun.org/main/NAUN/mechanics/2014/a102002-190.pdf
dc.subject Crosslinking en
dc.subject Irradiated en
dc.subject Nano-hardness en
dc.subject PA 11 en
dc.description.abstract The submitted paper presents the assessment of mechanical properties of the surface layer of modified polyamide 11. Hard surface layer was made using the technology of radiation crosslinking, which enables modification of polymer materials and hence the change of their end-use properties. The process of mechanical stress is applied by nanohardness test. The surface layer of polymer material such as polyamide 11 is modified by β - radiation. After the polyamide 11 is subjected to radiation, changes of the surface layer at applied load are observed. Material properties of the created surface layer are measured by nanohardness test using the DSI method (Depth Sensing Indentation). en
utb.faculty Faculty of Technology
dc.identifier.uri http://hdl.handle.net/10563/1003732
utb.identifier.obdid 43871847
utb.identifier.scopus 2-s2.0-84900368957
utb.source j-scopus
dc.date.accessioned 2014-06-05T20:22:54Z
dc.date.available 2014-06-05T20:22:54Z
utb.contributor.internalauthor Krátký, Petr
utb.contributor.internalauthor Maňas, David
utb.contributor.internalauthor Maňas, Miroslav
utb.contributor.internalauthor Staněk, Michal
utb.contributor.internalauthor Ovsík, Martin
utb.contributor.internalauthor Kyas, Kamil
utb.contributor.internalauthor Řezníček, Martin
utb.fulltext.affiliation P. Kratky, D. Manas, M. Manas, M. Stanek, M. Ovsik, K. Kyas, M. Reznicek Petr Kratky is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (phone: +420576035237; e-mail: kratky@ft.utb.cz). David Manas is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (e-mail: dmanas@ft.utb.cz). Miroslav Manas is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (e-mail: manas@ft.utb.cz). Michal Stanek is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (e-mail: stanek@ft.utb.cz). Martin Ovsik is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (e-mail: mbednarik@ft.utb.cz). Kamil Kyas is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (e-mail: kratky@ft.utb.cz). Martin Reznicek is with the Tomas Bata University in Zlin, nam. T. G. Masaryka 5555, 76001 Zlin, Czech Republic (e-mail: mizera@ft.utb.cz).
utb.fulltext.dates -
utb.fulltext.sponsorship This paper is supported by the internal grant of TBU in Zlin No. IGA/FT/2013/020 funded from the resources of specific university research and by the European Regional Development Fund under the project CEBIA-Tech No. CZ.1.05/2.1.00/03.0089 and Technology Agency of the Czech Republic as a part of the project called TA03010724 AV and EV LED luminaire with a higher degree of protection.
utb.fulltext.faculty Faculty of Technology
utb.fulltext.ou -
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