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Charge transient, electrochemical and impedance measurements as tools for characterization of nano-heterostructural organic/inorganic semiconductors

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dc.title Charge transient, electrochemical and impedance measurements as tools for characterization of nano-heterostructural organic/inorganic semiconductors en
dc.contributor.author Schauer, František
dc.contributor.author Nádaždy, Vojtech
dc.contributor.author Gmucová, Katarína
dc.contributor.author Weis, Martin
dc.contributor.author Kuřitka, Ivo
dc.contributor.author Rohovec, Jan
dc.contributor.author Toušek, Jiří
dc.contributor.author Toušková, Jana
dc.contributor.author Lányi, Štefan
dc.relation.ispartof Nanoscience and Nanotechnology Letters
dc.identifier.issn 1941-4900 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2013
utb.relation.volume 5
utb.relation.issue 4
dc.citation.spage 439
dc.citation.epage 443
dc.type article
dc.language.iso en
dc.publisher American Scientific Publishers en
dc.identifier.doi 10.1166/nnl.2013.1553
dc.subject Charge Transient Spectroscopy en
dc.subject Electrochemical Spectroscopy en
dc.subject Electron Structure Spectroscopy en
dc.subject Organic Materials Electron Structure en
dc.description.abstract Some organic small molecules as well as conjugated polymers are attractive organic semiconductors with rich applications in the branch of immerging organic electronics, e.g., in light-emitting, switching and photovoltaic devices. Surprisingly, there is the lack of methods, suitable for elucidation of basic injection and transport properties. This contribution deals with application of several techniques based on charge transient measurements, isothermal charge transient spectroscopy (IQTS) in microscopic mode, electrochemical methods of double step voltcoulometry (DSVCM) and electrochemical impedance spectroscopy (EIS), which are potentially suitable for obtaining information about basic parameters of traps and their influence on the transport properties. To test the characterization methods we first used the prototypical polysilane-poly[methyl(phenyl)silylene] (PMPSi). Phototodegradation of the by UV radiation is known to cause chain scission and creation of dangling bonds and weak bonds by known mechanisms. Next we show the applicability to study the electron structure of presented methods on PPV and blend of PPV and nano-CdS. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1003231
utb.identifier.obdid 43869618
utb.identifier.scopus 2-s2.0-84877771878
utb.identifier.wok 000317537500003
utb.source j-wok
dc.date.accessioned 2013-05-22T11:53:02Z
dc.date.available 2013-05-22T11:53:02Z
utb.contributor.internalauthor Schauer, František
utb.contributor.internalauthor Kuřitka, Ivo
utb.fulltext.affiliation F. Schauer1* ; V. Nadáždy2 ; K. Gmucová2 ; M. Weis2 ; I. Kuřitka3 ; J. Rohovec4 ; J. Toušek5 ; J. Toušková5 ; and Š. Lányi2 1 Faculty of Applied Informatics, Department of Electronics and Measurements, Tomas Bata University, Zlin, 76005, Czech Republic; and Faculty of Education, University of Trnava in Trnava, 91843, Slovak Republic 2 Institute of Physics, Slovak Academy of Sciences, Bratislava, 84511, Slovak Republic 3 Polymer Centre, Tomas Bata University, Zlin, 76005, Czech Republic 4 Institute of Geology, Academy of Sciences of Czech Republic, Prague, 16500, Czech Republic 5 Department of Macromolecular Physics, Charles University in Prague, Prague, 11636, Czech Republic *Author to whom correspondence should be addressed.
utb.fulltext.dates Received: 15 August 2011 Accepted: 20 February 2012
utb.fulltext.sponsorship The work in Slovak Republic was supported by the ASFEU project Centre for Applied Research of Nanoparticles, Activity 4.2, ITMS code 26240220011, supported by the Research and Development Operational Programme funded by the ERDF, by Slovak Grant Agency VEGA 2/0093/10, 2/0063/11, and by Centre of Excellence SAS for Functionalized Multiphase Materials (FUN-MAT). The paper was also partially supported by APVV-0096-11 project in 2012.
utb.fulltext.faculty Faculty of Applied Informatics
utb.fulltext.ou Department of Electronics and Measurements
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