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The counterfeit components V-I characteristics difference study

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dc.title The counterfeit components V-I characteristics difference study en
dc.contributor.author Neumann, Petr
dc.contributor.author Adámek, Milan
dc.contributor.author Skočík, Petr
dc.relation.ispartof WSEAS Transactions on Circuits and Systems
dc.identifier.issn 1109-2734 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2012
utb.relation.volume 11
utb.relation.issue 8
dc.citation.spage 259
dc.citation.epage 271
dc.type article
dc.language.iso en
dc.publisher World Scientific and Engineering Academy and Society (WSEAS) en
dc.relation.uri http://www.wseas.org/multimedia/journals/circuits/2012/53-800.pdf
dc.subject Comparison criteria en
dc.subject Counterfeit component en
dc.subject Counterfeit detector en
dc.subject Master component en
dc.subject Pin print en
dc.subject Scan profile en
dc.subject V-I characteristic en
dc.description.abstract The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. That voltage varies between two safe, for the component health limits, during the V-I characteristic recording. The applied voltage variation follows a certain function like sinus or ramp. The V-I characteristics of an individual component type can differ according to production technology, according to a particular manufacturer, or according to measurement conditions itself. Those so called natural differences can be registered by the study of statistically significant component population with known origin and history, and they can be subsumed in the comparison master pin print. That comparison master pin print is subsequently used as a criterion for discovering differences caused by improper treatment, failure or by the counterfeiting process. The article illustrates a counterfeit detector application for comparative V-I characteristics analysis aimed at a relevant knowledge base development for particular production technologies and component types. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1003117
utb.identifier.rivid RIV/70883521:28140/12:43869026!RIV13-MSM-28140___
utb.identifier.obdid 43869247
utb.identifier.scopus 2-s2.0-84872709279
utb.source j-scopus
dc.date.accessioned 2013-02-05T01:44:51Z
dc.date.available 2013-02-05T01:44:51Z
dc.rights Attribution 4.0 International
dc.rights.uri http://creativecommons.org/licenses/by/4.0/
dc.rights.access openAccess
utb.contributor.internalauthor Neumann, Petr
utb.contributor.internalauthor Adámek, Milan
utb.contributor.internalauthor Skočík, Petr
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