The counterfeit components V-I characteristics difference study

Abstract

The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. That voltage varies between two safe, for the component health limits, during the V-I characteristic recording. The applied voltage variation follows a certain function like sinus or ramp. The V-I characteristics of an individual component type can differ according to production technology, according to a particular manufacturer, or according to measurement conditions itself. Those so called natural differences can be registered by the study of statistically significant component population with known origin and history, and they can be subsumed in the comparison master pin print. That comparison master pin print is subsequently used as a criterion for discovering differences caused by improper treatment, failure or by the counterfeiting process. The article illustrates a counterfeit detector application for comparative V-I characteristics analysis aimed at a relevant knowledge base development for particular production technologies and component types.