Publikace UTB
Repozitář publikační činnosti UTB

How can V-I characteristics help in counterfeit component detection

Repozitář DSpace/Manakin

Zobrazit minimální záznam


dc.title How can V-I characteristics help in counterfeit component detection en
dc.contributor.author Neumann, Petr
dc.contributor.author Adámek, Milan
dc.contributor.author Skočík, Petr
dc.relation.ispartof Annals of DAAAM and Proceedings of the International DAAAM Symposium
dc.identifier.issn 1726-9679 Scopus Sources, Sherpa/RoMEO, JCR
dc.identifier.isbn 978-3-901509-83-4
dc.date.issued 2011
dc.citation.spage 57
dc.citation.epage 58
dc.event.title Annals of DAAAM for 2011 and 22nd International DAAAM Symposium "Intelligent Manufacturing and Automation: Power of Knowledge and Creativity"
dc.event.location Vienna
utb.event.state-en Austria
utb.event.state-cs Rakousko
dc.event.sdate 2011-11-23
dc.event.edate 2011-11-26
dc.type conferenceObject
dc.language.iso en
dc.publisher Danube Adria Association for Automation and Manufacturing, DAAAM
dc.identifier.doi 10.2507/22nd.daaam.proceedings.029
dc.relation.uri https://daaam.info/22nd-proceedings-2011
dc.relation.uri https://www.daaam.info/Downloads/Pdfs/proceedings/proceedings_2011/029.pdf
dc.subject counterfeit component en
dc.subject counterfeit detector en
dc.subject pin print en
dc.subject scan profile en
dc.subject V-I characteristic en
dc.description.abstract The counterfeit electronic components represent a serious problem nowadays. This paper illustrates a V-I characteristic based counterfeit detector application possibilities. The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. The applied voltage course follows a certain function like sinus, triangle or ramp between safe limits. The V-I characteristics of an individual component type can differ according to production technology, according to particular manufacturer, or according to the measurement conditions itself. The natural differences can be subsumed in the model component pin print which can be used for the comparative analysis aimed at discovering unnatural differences caused by improper treatment, failure or by the counterfeiting process. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1011240
utb.identifier.obdid 43866781
utb.identifier.scopus 2-s2.0-84904289153
utb.source d-scopus
dc.date.accessioned 2023-01-06T08:03:57Z
dc.date.available 2023-01-06T08:03:57Z
utb.contributor.internalauthor Neumann, Petr
utb.contributor.internalauthor Adámek, Milan
utb.contributor.internalauthor Skočík, Petr
utb.fulltext.dates -
utb.fulltext.sponsorship The work has been supported by the Ministry of Education, Youth and Sports of the Czech Republic under the Research Plan No. MSM 7088352102 and by the European Regional Development Fund under the project CEBIA-Tech No. CZ.1.05/2.1.00/03. This support is very gratefully accepted.
utb.fulltext.projects MSM 7088352102
utb.fulltext.projects CZ.1.05/2.1.00/03
utb.fulltext.faculty -
utb.fulltext.ou -
Find Full text

Soubory tohoto záznamu

Zobrazit minimální záznam