TBU Publications
Repository of TBU Publications

Advanced microscopic techniques used for integrated circuits authenticity analysis

DSpace Repository


Find Full text Export to RefWorks
   

 

Files in this item

ČSN ISO 690:2011 citation

Citace článku v konferenčním sborníku:
NAVRÁTIL, Milan, Petr NEUMANN a Vojtěch KŘESÁLEK. Advanced microscopic techniques used for integrated circuits authenticity analysis. In: Journal of Physics: Conference Series [online]. Belfast: Institute of Physics Publishing, 2018 [cit. 2019-12-06]. ISSN 1742-6588. Dostupné z: http://iopscience.iop.org/article/10.1088/1742-6596/1065/10/102015/meta.

These citations are software generated and may contain errors. To verify accuracy, check the appropriate style guide.

Related articles