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A preliminary study of counterfeit electronic components using Raman spectroscopy

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dc.title A preliminary study of counterfeit electronic components using Raman spectroscopy en Vašková, Hana Neumann, Petr Kozubík, Mikuláš
dc.relation.ispartof MATEC Web of Conferences
dc.identifier.issn 2261-236X OCLC, Ulrich, Sherpa/RoMEO, JCR 2018
utb.relation.volume 210
dc.event.title 22nd International Conference on Circuits, Systems, Communications and Computers, CSCC 2018
dc.event.location Majorca
utb.event.state-en Spain
utb.event.state-cs Španělsko
dc.event.sdate 2018-07-14
dc.event.edate 2018-07-17
dc.type conferenceObject
dc.language.iso en
dc.publisher EDP Sciences
dc.identifier.doi 10.1051/matecconf/201821002034
dc.description.abstract In today's world, people are surrounded by diverse electronic devices. Their integral parts are electronic components. In recent years, an increasing incidence of counterfeit electronic components has appeared which may compromise reliability, functionality and other related purposes. The aim of the paper is to determine whether Raman spectroscopy is a suitable method for assessing the authenticity of electronic components on the basis of material analysis. Raman spectroscopy is a powerful method for material identification offering specific information on molecular level. The focus of measurements was on materials of packages and the markings. The polymer-based and ceramic-based electronic components were analysed as well as the paints of the markings. The results of this preliminary study positively indicate the potential to distinguish different materials of electronic components by Raman spectroscopy. © 2018 The Authors, published by EDP Sciences. en
utb.faculty Faculty of Applied Informatics
utb.identifier.scopus 2-s2.0-85055525275
utb.source d-scopus 2019-01-03T12:31:46Z 2019-01-03T12:31:46Z
utb.contributor.internalauthor Vašková, Hana
utb.contributor.internalauthor Neumann, Petr
utb.contributor.internalauthor Kozubík, Mikuláš
utb.scopus.affiliation Tomas Bata University in Zlin, Faculty of Applied Informatics, Department of Electronic and Measurements, Zlin, Czech Republic
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