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Characterization of epitaxial layers using scanning microwave microscopy

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Citace článku v konferenčním sborníku:
MARTÍNEK, Tomáš, Josef KUDĚLKA, Milan NAVRÁTIL a Vojtěch KŘESÁLEK. Characterization of epitaxial layers using scanning microwave microscopy. In: Annals of DAAAM and Proceedings of the International DAAAM Symposium [online]. Zadar: Danube Adria Association for Automation and Manufacturing, DAAAM, 2015, s. 1109-1114. [cit. 2019-04-22]. ISSN 1726-9679. Dostupné z: http://doi.org/10.2507/26th.daaam.proceedings.045.

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