Optical properties of thin tungsten films

Martínek, Tomáš

dc.title	Optical properties of thin tungsten films	en
dc.contributor.author	Martínek, Tomáš
dc.relation.ispartof	Proceedings - 26th International Conference on Circuits, Systems, Communications and Computers, CSCC 2022
dc.identifier.isbn	978-1-6654-8186-1
dc.date.issued	2022
dc.citation.spage	20
dc.citation.epage	22
dc.event.title	26th International Conference on Circuits, Systems, Communications and Computers, CSCC 2022
dc.event.location	Chania, Crete Island
utb.event.state-en	Greece
utb.event.state-cs	Řecko
dc.event.sdate	2022-07-19
dc.event.edate	2022-07-22
dc.type	conferenceObject
dc.language.iso	en
dc.publisher	Institute of Electrical and Electronics Engineers Inc.
dc.identifier.doi	10.1109/CSCC55931.2022.00013
dc.relation.uri	https://ieeexplore.ieee.org/document/10017525
dc.relation.uri	https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10017525
dc.subject	absorbance	en
dc.subject	Atomic force microscopy	en
dc.subject	diagnostic	en
dc.subject	optical properties	en
dc.subject	transmittance	en
dc.subject	tungsten	en
dc.description.abstract	In this work optical properties of thin tungsten films deposited by radiofrequency magnetron sputtering close to insulator-conductor transition were investigated for their potential use in optoelectronics. These films were deposited on a V1 mica substrate. An atomic force microscopy topographical maps, optical absorbance measured on a spectrophotometer, and optical transmittance results were reported. © 2022 IEEE.	en
utb.faculty	Faculty of Applied Informatics
dc.identifier.uri	http://hdl.handle.net/10563/1011398
utb.identifier.obdid	43883669
utb.identifier.scopus	2-s2.0-85147735527
utb.source	d-scopus
dc.date.accessioned	2023-02-25T13:54:24Z
dc.date.available	2023-02-25T13:54:24Z
utb.ou	Department of Electronics and Measurements
utb.contributor.internalauthor	Martínek, Tomáš
utb.fulltext.sponsorship	This work was supported by the project Technical Sciences for Safe Society – Electromagnetic Compatibility in Security Applications.
utb.scopus.affiliation	Tomas Bata University in Zlín, Faculty of Applied Informatics, Dept. of Electronics and Measurements, Zlín, Czech Republic