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Nano-steganography using atomic force microscopy

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Citace článku v konferenčním sborníku:
KUDĚLKA, Josef, Tomáš MARTÍNEK, Milan NAVRÁTIL a Vojtěch KŘESÁLEK. Nano-steganography using atomic force microscopy. In: 16th International Conference on Nanotechnology - IEEE NANO 2016 [online]. Sendai: Institute of Electrical and Electronics Engineers (IEEE), 2016, s. 157-159. [cit. 2024-05-20]. Dostupné z: http://ieeexplore.ieee.org/document/7751451/.

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