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Some methods for electronic component authenticity assessment

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dc.title Some methods for electronic component authenticity assessment en
dc.contributor.author Neumann, Petr
dc.contributor.author Houser, Josef
dc.contributor.author Pospíšilík, Martin
dc.contributor.author Skočík, Petr
dc.contributor.author Adámek, Milan
dc.relation.ispartof Annals of DAAAM and Proceedings of the International DAAAM Symposium
dc.identifier.issn 1726-9679 Scopus Sources, Sherpa/RoMEO, JCR
dc.identifier.isbn 978-3-902734-07-5
dc.date.issued 2015
utb.relation.volume 2015-January
dc.citation.spage 18
dc.citation.epage 26
dc.event.title 26th DAAAM International Symposium on Intelligent Manufacturing and Automation, DAAAM 2015
dc.event.location Zadar
utb.event.state-en Croatia
utb.event.state-cs Chorvatsko
dc.event.sdate 2015-10-21
dc.event.edate 2015-10-24
dc.type conferenceObject
dc.language.iso en
dc.publisher Danube Adria Association for Automation and Manufacturing, DAAAM
dc.identifier.doi 10.2507/26th.daaam.proceedings.003
dc.relation.uri http://doi.org/10.2507/26th.daaam.proceedings.045
dc.subject Analogue Signature Analysis en
dc.subject Coaxial Light en
dc.subject Dark Field light en
dc.subject I-V characteristics en
dc.subject Laser Decapsulation en
dc.subject Pin Print en
dc.subject SoC System on Chip en
dc.description.abstract The spurious aka counterfeit components represent still a serious danger for functionality, reliability and lifetime of any electronic device these components are part of its manufactured assembly. There exist a lot of methods aimed at revealing counterfeit components before they are used in electronic module production. Those methods differ in complexity and also in counterfeit component filtering yield. In short, any efficient method based on specification parameters manifestation, functionality and appearance comparison is applicable. This presentation illustrates the diagnostic abilities of some representative methods for counterfeit components preventive filtering from a production process. As a result of our research activities, the capability of popularly known Analogue Signature Analysis method is mentioned and illustrated as well as laser decapsulation method and a comparison of visual features accentuated with light exposure. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1006784
utb.identifier.obdid 43873846
utb.identifier.scopus 2-s2.0-84987677374
utb.source d-scopus
dc.date.accessioned 2016-12-22T16:19:11Z
dc.date.available 2016-12-22T16:19:11Z
dc.rights Attribution-NonCommercial 4.0 International
dc.rights.uri http://creativecommons.org/licenses/by-nc/4.0/
dc.rights.access openAccess
utb.contributor.internalauthor Neumann, Petr
utb.contributor.internalauthor Houser, Josef
utb.contributor.internalauthor Pospíšilík, Martin
utb.contributor.internalauthor Skočík, Petr
utb.contributor.internalauthor Adámek, Milan
utb.fulltext.affiliation Petr Neumann a , , Josef Houser b , Martin Pospíšilík a , Petr Skočík a , Milan Adámek a a Faculty of applied informatics, Tomas Bata Univerzity in Zlin, Nad Stráněmi 4511, Zlin 76005, Czech Republic, b Faculty of Technology, Tomas Bata University in Zlin, Vavrečkova 275, Zlin 76272, Czech Republic
utb.fulltext.dates -
utb.fulltext.sponsorship This work was supported by the Ministry of Education, Youth and Sports of the Czech Republic within the National Sustainability Program project No. LO1303 (MSMT-7778/2014).
utb.fulltext.projects LO1303 (MSMT-7778/2014)
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