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Counterfeit electronic components detection possibilities

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dc.title Counterfeit electronic components detection possibilities en
dc.contributor.author Neumann, Petr
dc.contributor.author Adámek, Milan
dc.contributor.author Skočík, Petr
dc.relation.ispartof Recent Researches in Automatic Control - 13th WSEAS International Conference on Automatic Control, Modelling and Simulation, ACMOS'11
dc.identifier.isbn 9781618040046
dc.date.issued 2011
dc.citation.spage 185
dc.citation.epage 188
dc.event.title 13th WSEAS International Conference on Automatic Control, Modelling and Simulation, ACMOS'11
dc.event.location Lanzarote, Canary Islands
utb.event.state-en Spain
utb.event.state-cs Španělsko
dc.event.sdate 2011-05-27
dc.event.edate 2011-05-29
dc.type conferenceObject
dc.language.iso en
dc.relation.uri http://www.wseas.us/e-library/conferences/2011/Lanzarote/ACMOS/ACMOS-34.pdf
dc.subject Component pin print en
dc.subject Counterfeit component en
dc.subject Counterfeit detector en
dc.subject Scan mode en
dc.subject V-I characteristic en
dc.description.abstract The counterfeit electronic components detection methods are mainly aimed at characteristic features which are relatively difficult to copy in original quality and accuracy. Electric parametric tests in various complexities are very efficient in revealing discrepancies. The curve tracing methods are reasonably simple and accessible. At our workplace, we deal with electronic components V-I characteristic analysis performed on components samples gained directly from the industrial area in frames of our cooperation with companies producing electronic modules. We have a counterfeit detector with a sophisticated concept of V-I characteristic measurement and comparison at our disposal. We are collecting data on various component types and component production technologies. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1004759
utb.identifier.obdid 43866780
utb.identifier.scopus 2-s2.0-82555200686
utb.source d-scopus
dc.date.accessioned 2015-06-04T12:55:20Z
dc.date.available 2015-06-04T12:55:20Z
utb.contributor.internalauthor Neumann, Petr
utb.contributor.internalauthor Adámek, Milan
utb.contributor.internalauthor Skočík, Petr
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