Kontaktujte nás | Jazyk: čeština English
dc.title | Counterfeit electronic components detection possibilities | en |
dc.contributor.author | Neumann, Petr | |
dc.contributor.author | Adámek, Milan | |
dc.contributor.author | Skočík, Petr | |
dc.relation.ispartof | Recent Researches in Automatic Control - 13th WSEAS International Conference on Automatic Control, Modelling and Simulation, ACMOS'11 | |
dc.identifier.isbn | 978-1-61804-004-6 | |
dc.date.issued | 2011 | |
dc.citation.spage | 185 | |
dc.citation.epage | 188 | |
dc.event.title | 13th WSEAS International Conference on Automatic Control, Modelling and Simulation, ACMOS'11 | |
dc.event.location | Lanzarote, Canary Islands | |
utb.event.state-en | Spain | |
utb.event.state-cs | Španělsko | |
dc.event.sdate | 2011-05-27 | |
dc.event.edate | 2011-05-29 | |
dc.type | conferenceObject | |
dc.language.iso | en | |
dc.relation.uri | http://www.wseas.us/e-library/conferences/2011/Lanzarote/ACMOS/ACMOS-34.pdf | |
dc.subject | Component pin print | en |
dc.subject | Counterfeit component | en |
dc.subject | Counterfeit detector | en |
dc.subject | Scan mode | en |
dc.subject | V-I characteristic | en |
dc.description.abstract | The counterfeit electronic components detection methods are mainly aimed at characteristic features which are relatively difficult to copy in original quality and accuracy. Electric parametric tests in various complexities are very efficient in revealing discrepancies. The curve tracing methods are reasonably simple and accessible. At our workplace, we deal with electronic components V-I characteristic analysis performed on components samples gained directly from the industrial area in frames of our cooperation with companies producing electronic modules. We have a counterfeit detector with a sophisticated concept of V-I characteristic measurement and comparison at our disposal. We are collecting data on various component types and component production technologies. | en |
utb.faculty | Faculty of Applied Informatics | |
dc.identifier.uri | http://hdl.handle.net/10563/1004759 | |
utb.identifier.obdid | 43866780 | |
utb.identifier.scopus | 2-s2.0-82555200686 | |
utb.source | d-scopus | |
dc.date.accessioned | 2015-06-04T12:55:20Z | |
dc.date.available | 2015-06-04T12:55:20Z | |
utb.contributor.internalauthor | Neumann, Petr | |
utb.contributor.internalauthor | Adámek, Milan | |
utb.contributor.internalauthor | Skočík, Petr |