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Energy resolved electrochemical impedance spectroscopy for electronic structure mapping in organic semiconductors

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dc.title Energy resolved electrochemical impedance spectroscopy for electronic structure mapping in organic semiconductors en
dc.contributor.author Nádaždy, Vojtech
dc.contributor.author Schauer, František
dc.contributor.author Gmucová, Katarína
dc.relation.ispartof Applied Physics Letters
dc.identifier.issn 0003-6951 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2014
utb.relation.volume 105
utb.relation.issue 14
dc.type article
dc.language.iso en
dc.publisher American Institute of Physics (AIP)
dc.identifier.doi 10.1063/1.4898068
dc.relation.uri http://scitation.aip.org/content/aip/journal/apl/105/14/10.1063/1.4898068
dc.description.abstract We introduce an energy resolved electrochemical impedance spectroscopy method to map the electronic density of states (DOS) in organic semiconductor materials. The method consists in measurement of the charge transfer resistance of a semiconductor/electrolyte interface at a frequency where the redox reactions determine the real component of the impedance. The charge transfer resistance value provides direct information about the electronic DOS at the energy given by the electrochemical potential of the electrolyte, which can be adjusted using an external voltage. A simple theory for experimental data evaluation is proposed, along with an explanation of the corresponding experimental conditions. The method allows mapping over unprecedentedly wide energy and DOS ranges. Also, important DOS parameters can be determined directly from the raw experimental data without the lengthy analysis required in other techniques. The potential of the proposed method is illustrated by tracing weak bond defect states induced by ultraviolet treatment above the highest occupied molecular orbital in a prototypical σ-conjugated polymer, poly[methyl(phenyl)silylene]. The results agree well with those of our previous DOS reconstruction by post-transient space-charge-limited-current spectroscopy, which was, however, limited to a narrow energy range. In addition, good agreement of the DOS values measured on two common π-conjugated organic polymer semiconductors, polyphenylene vinylene and poly(3-hexylthiophene), with the rather rare previously published data demonstrate the accuracy of the proposed method. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1003864
utb.identifier.obdid 43873242
utb.identifier.scopus 2-s2.0-84907978745
utb.identifier.wok 000344343900036
utb.identifier.coden APPLA
utb.source j-scopus
dc.date.accessioned 2014-11-19T09:23:40Z
dc.date.available 2014-11-19T09:23:40Z
dc.rights.access openAccess
utb.contributor.internalauthor Schauer, František
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