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Analysis of Conducted Emission with influences of operating frequencies and amplitudes of a self-oscillating capacitive touch sensing circuit

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dc.title Analysis of Conducted Emission with influences of operating frequencies and amplitudes of a self-oscillating capacitive touch sensing circuit en
dc.contributor.author Saravana Sankar, Subramaniam
dc.contributor.author Kovář, Stanislav
dc.contributor.author Dawson, John F.
dc.contributor.author Galda, Michael
dc.relation.ispartof Proceedings of the International Symposium on Electromagnetic Compatibility, EMC Europe
dc.identifier.issn 2325-0356 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2024
utb.relation.issue 2024
dc.citation.spage 459
dc.citation.epage 463
dc.event.title 2024 International Symposium on Electromagnetic Compatibility, EMC Europe 2024
dc.event.location Bruges
utb.event.state-en Belgium
utb.event.state-cs Belgie
dc.event.sdate 2024-09-02
dc.event.edate 2024-09-05
dc.type conferenceObject
dc.language.iso en
dc.publisher Institute of Electrical and Electronics Engineers Inc.
dc.identifier.doi 10.1109/EMCEurope59828.2024.10722326
dc.relation.uri https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10722326
dc.subject conducted emission en
dc.subject frequency domain analysis en
dc.subject time domain analysis en
dc.subject time-frequency domain analysis en
dc.description.abstract In the rapidly evolving field of human-machine interfaces (HMI), particularly in the realm of touch screen technologies, capacitive touch sensing has gained prominence due to its superior flexibility and cost-effectiveness compared to other touch interfaces, such as resistive-based methods, infrared touch sensors, and surface acoustic wave sensors. However, this advancement comes with increased emission and susceptibility to Electromagnetic Interference (EMI) and similar disturbances, notably due to factors like operating sensing frequency and voltage. The previous research underscored the challenges of Electromagnetic Emission and some drawbacks of operating capacitive sensors at higher excitation frequencies. Characteristics of traditional capacitance to digital circuits like sigma-delta capacitive sensing circuits operate at higher frequencies, thus producing challenges in terms of emission and susceptibility. This paper offers a detailed assessment of the conducted electromagnetic emissions in a self-oscillating capacitance-to-time converter. The study primarily investigates how conducted emission characteristics change in response to the sensing circuit's operating frequency and voltage variations. The oscillating capacitive sensing circuit conducts sensing with a single clock cycle, thus mitigating some of the issues associated with the traditional capacitive sensing circuits, such as sigma-delta capacitive sensing, which generally require a higher frequency of operations. The results indicate that as the sensing frequency and the operating voltage decrease, the conducted emission of the sensor improves; this phenomenon can be particularly beneficial in high EMI environments like the automotive industry, where capacitive touch sensors are placed close to sensitive electronics. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1012327
utb.identifier.scopus 2-s2.0-85212181058
utb.identifier.wok 001353599400085
utb.source d-scopus
dc.date.accessioned 2025-01-30T10:36:22Z
dc.date.available 2025-01-30T10:36:22Z
dc.description.sponsorship European Union's Horizon Europe research and innovation program; UK Research and Innovation, UKRI; H2020 Marie Skłodowska-Curie Actions, MSCA, (101072881); H2020 Marie Skłodowska-Curie Actions, MSCA
dc.description.sponsorship European Union's Horizon Europe research and innovation program under the Marie Sklodowska-Curie grant [101072881]; UKRI
dc.rights Attribution 4.0 International
dc.rights.uri http://creativecommons.org/licenses/by/4.0/
dc.rights.access openAccess
utb.ou Department of Security Engineering
utb.contributor.internalauthor Saravana Sankar, Subramaniam
utb.contributor.internalauthor Kovář, Stanislav
utb.wos.affiliation [Sankar, Subramaniam Saravana; Kovar, Stanislav] Tomas Bata Univ Zlin, Fac Appl Informat, Dept Secur Engn, Zlin, Czech Republic; [Dawson, John F.] Univ York, Sch Phys Engn & Technol, York, N Yorkshire, England; [Galda, Michael] NXP Semicond, Syst Engn, Roznov Pod Radhostem, Czech Republic
utb.scopus.affiliation Tomas Bata University, Faculty of Applied Informatics, Department of Security Engineering, Zlin, Czech Republic; University of York, School of Physics Engineering and Technology, United Kingdom; Systems Engineering, Nxp Semiconductors, Czech Republic
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Attribution 4.0 International Kromě případů, kde je uvedeno jinak, licence tohoto záznamu je Attribution 4.0 International