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Side charge propagation in simultaneous KPFM and transport measurement of humidity exposed graphene FET sensor

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dc.title Side charge propagation in simultaneous KPFM and transport measurement of humidity exposed graphene FET sensor en
dc.contributor.author Švarc, Vojtěch
dc.contributor.author Bartošík, Miroslav
dc.contributor.author Konečný, Martin
dc.contributor.author Piastek, Jakub
dc.contributor.author Nezval, David
dc.contributor.author Mach, Jindřich
dc.contributor.author Šikola, Tomáš
dc.relation.ispartof Carbon
dc.identifier.issn 0008-6223 Scopus Sources, Sherpa/RoMEO, JCR
dc.identifier.issn 1873-3891 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2023
utb.relation.volume 215
dc.type article
dc.language.iso en
dc.publisher Elsevier Ltd
dc.identifier.doi 10.1016/j.carbon.2023.118471
dc.relation.uri https://www.sciencedirect.com/science/article/pii/S0008622323007169
dc.relation.uri https://www.sciencedirect.com/science/article/pii/S0008622323007169/pdfft?md5=56169fb0bce121de557f49497a40093f&pid=1-s2.0-S0008622323007169-main.pdf
dc.subject graphene en
dc.subject Hall bar en
dc.subject side charge en
dc.subject KPFM en
dc.subject FET en
dc.description.abstract The surface diffusion (dissipation) of charge carriers enhanced by water molecules in solution-based biosensors and ambient operating gas sensors strongly influence their resistance response, sensitivity, and stability in time. Therefore, the information on the charge distribution at interfaces of conductive and insulating parts is essential for the operating sensors. This work presents the simultaneous measurement of the longitudinal macroscopic resistance response and local surface potential (SP) mapping by Kelvin probe force microscopy (KPFM) on a graphene Hall bar sensor. The results show the propagation of an electric charge from the main graphene channel onto the neighboring SiO2 surface. The charge propagation strongly increases with the relative humidity and can be controlled by a bottom-gate voltage used in most sensors based on a field effect transistor (FET) architecture. As proved by the longitudinal resistance measurements, the resulting side charge accumulation has a very small impact on the 2D resistivity of the graphene channel. It has been explained by an application of the Thomas-Fermi theory, proving an efficient screening of side accumulated charge potential caused by a redistribution of the charge inside the wide graphene channel. The combination of a transport resistance response and KPFM provides a deeper understanding of sensors/biosensors functionality and their design features than a simple resistance response usually observed. en
utb.faculty Faculty of Technology
dc.identifier.uri http://hdl.handle.net/10563/1011722
utb.identifier.obdid 43884942
utb.identifier.scopus 2-s2.0-85173172187
utb.identifier.wok 001087284600001
utb.identifier.coden CRBNA
utb.source j-scopus
dc.date.accessioned 2023-12-05T11:36:34Z
dc.date.available 2023-12-05T11:36:34Z
dc.description.sponsorship Ministerstvo Školství, Mládeže a Tělovýchovy, MŠMT, (LM2023051, LQ1601 – CEITEC 2020); Grantová Agentura České Republiky, GA ČR, (23-07617S); European Regional Development Fund, ERDF, (CZ.1.05/1.1.00/02.0068)
dc.description.sponsorship Grant Agency of the Czech Republic [23-07617S]; European Regional Development Fund [CZ.1.05/1.1.00/02.0068]; MEYS CR [LQ1601 - CEITEC 2020]; CzechNanoLab Research Infrastructure - MEYS CR [LM2023051]
utb.ou Department of Physics and Materials Engineering
utb.contributor.internalauthor Bartošík, Miroslav
utb.fulltext.sponsorship We acknowledge the support by the Grant Agency of the Czech Republic (grant No. 23-07617S) and European Regional Development Fund (project No. CZ.1.05/1.1.00/02.0068), MEYS CR (project No. LQ1601 – CEITEC 2020) and CzechNanoLab Research Infrastructure supported by MEYS CR (LM2023051).
utb.wos.affiliation [Svarc, Vojtech; Bartosik, Miroslav; Konecny, Martin; Piastek, Jakub; Nezval, David; Mach, Jindrich; Sikola, Tomas] Brno Univ Technol CEITEC BUT, Cent European Inst Technol, Purkynova 123, Brno 61200, Czech Republic; [Svarc, Vojtech; Bartosik, Miroslav; Konecny, Martin; Piastek, Jakub; Nezval, David; Mach, Jindrich; Sikola, Tomas] Brno Univ Technol, Inst Phys Engn, Tech 2896-2, Brno 61669, Czech Republic; [Bartosik, Miroslav] Tomas Bata Univ Zlin, Fac Technol, Dept Phys & Mat Engn, Zlin 76001, Czech Republic
utb.scopus.affiliation Central European Institute of Technology – Brno University of Technology (CEITEC BUT) Purkyňova 123, Brno, 612 00, Czech Republic; Institute of Physical Engineering, Brno University of Technology, Technická 2, Brno, 616 69, Czech Republic; Department of Physics and Materials Engineering, Faculty of Technology, Tomas Bata Universty in Zlín, 760 01, Czech Republic
utb.fulltext.projects 23-07617S
utb.fulltext.projects CZ.1.05/1.1.00/02.0068
utb.fulltext.projects LQ1601 – CEITEC 2020
utb.fulltext.projects LM2023051
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