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Nanohardness of electron beam irradiated polyamide 6.6
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| Title: | Nanohardness of electron beam irradiated polyamide 6.6 | ||||||||||
| Author: | Maňas, David; Ovsík, Martin; Maňas, Miroslav; Staněk, Michal; Kocman, Karel; Bednařík, Martin; Krátký, Petr | ||||||||||
| Document type: | Conference paper (English) | ||||||||||
| Source document: | Key Engineering Materials. 2014, vol. 606, p. 257-260 | ||||||||||
| ISSN: | 1013-9826 (Sherpa/RoMEO, JCR) | ||||||||||
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| DOI: | https://doi.org/10.4028/www.scientific.net/KEM.606.257 | ||||||||||
| Abstract: | Nanomechanical changes in the surface layer of polyamide 6.6 modified by beta radiation were measured by instrumented test of nanohardness. The specimens were prepared by injection technology and subjected to radiation doses of 0, 33, 66, 99, 132, 165, 198kGy. Measurements of nanohardness showed considerable changes of behavior of surface layer in middle as well as high radiation doses with higher values of indentation hardness and stiffness. © (2014) Trans Tech Publications, Switzerland. | ||||||||||
| Full text: | https://www.scientific.net/KEM.606.257 | ||||||||||
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ČSN ISO 690:2011 citation
Citace článku v konferenčním sborníku:
MAŇAS, David, Martin OVSÍK, Miroslav MAŇAS, Michal STANĚK, Karel KOCMAN, Martin BEDNAŘÍK a Petr KRÁTKÝ. Nanohardness of electron beam irradiated polyamide 6.6. In: Key Engineering Materials [online]. Kutná Hora: Trans Tech Publications Ltd, 2014, s. 257-260. [cit. 2024-11-19]. ISSN 1013-9826. Dostupné z: https://www.scientific.net/KEM.606.257.
These citations are software generated and may contain errors. To verify accuracy, check the appropriate style guide.
MAŇAS, David, Martin OVSÍK, Miroslav MAŇAS, Michal STANĚK, Karel KOCMAN, Martin BEDNAŘÍK a Petr KRÁTKÝ. Nanohardness of electron beam irradiated polyamide 6.6. In: Key Engineering Materials [online]. Kutná Hora: Trans Tech Publications Ltd, 2014, s. 257-260. [cit. 2024-11-19]. ISSN 1013-9826. Dostupné z: https://www.scientific.net/KEM.606.257.
These citations are software generated and may contain errors. To verify accuracy, check the appropriate style guide.
