Browsing by Subject "atomic force microscopy"

Now showing items 1-5 of 5

The effect of scratching direction in AFM nanolithography

Kudělka, Josef; Martínek, Tomáš; Navrátil, Milan; Křesálek, Vojtěch (Institute of Electrical and Electronics Engineers (IEEE), 2017)
The effect of tip speed in AFM scratching

Kudělka, Josef; Martínek, Tomáš; Navrátil, Milan; Křesálek, Vojtěch (Institute of Electrical and Electronics Engineers (IEEE), 2016)
Factors determining self-assembly of hyaluronan

Kocourková, Karolína; Musilová, Lenka; Smolka, Petr; Mráček, Aleš; Humenik, Martin; Minařík, Antonín (Elsevier Ltd, 2021)
Ligand-directed immobilization of proteins through an esterase 2 fusion tag studied by atomic force microscopy

Minařík, Antonín; Humeník, Martin; Li, Sheng; Huang, Yiwei; Krausch, Georg; Sprinzl, Mathias (Wiley-VCH Verlag GmbH & Co., 2008-01-04)
Nanoscale characterization of ultra-thin tungsten films deposited by radio-frequency magnetron sputtering

Martínek, Tomáš; Kudělka, Josef; Navrátil, Milan; Křesálek, Vojtěch; Fejfar, Antonín; Hývl, Matěj; Sobota, Jaroslav (Institute of Electrical and Electronics Engineers (IEEE), 2015)

Now showing items 1-5 of 5

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