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Thickness Effect on Structural Defect-Related Density of States and Crystallinity in P3HT Thin Films on ITO Substrates

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Citace článku v časopise:
NÁDAŽDY, Vojtech, Katarina GMUCOVÁ, Peter NÁDAŽDY, Peter SIFFALOVIC, Karol VEGSO, Matej JERGEL, František SCHAUER a Eva MAJKOVÁ. Thickness Effect on Structural Defect-Related Density of States and Crystallinity in P3HT Thin Films on ITO Substrates. Journal of Physical Chemistry C [online]. 2018, vol. 122, iss. 11, s. 5881-5887. [cit. 2019-06-18]. ISSN 1932-7447. Dostupné z: https://pubs.acs.org/doi/10.1021/acs.jpcc.7b11651.

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