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Electronic structure mapping of branching states in poly[methyl(phenyl)silane] upon exposure to UV radiation

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ČSN ISO 690:2011 citation

Citace článku v časopise:
SCHAUER, František, Lukáš TKÁČ, Miroslava OŽVOLDOVÁ, Vojtech NADÁŽDY, Katarína GMUCOVÁ, Karol VÉGSÖ, Miroslava TKÁČOVÁ a Juraj CHLPÍK. Electronic structure mapping of branching states in poly[methyl(phenyl)silane] upon exposure to UV radiation. Journal of the Korean Physical Society [online]. 2016, vol. 68, iss. 4, s. 563-568. [cit. 2019-04-22]. ISSN 0374-4884. Dostupné z: http://link.springer.com/article/10.3938/jkps.68.563.

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