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Optimization of poly-(methylphenylsilylene) specimens for cathodoluminescence measurement

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dc.title Optimization of poly-(methylphenylsilylene) specimens for cathodoluminescence measurement en
dc.contributor.author Schauer, Petr
dc.contributor.author Nešpůrek, Stanislav
dc.contributor.author Schauer, František
dc.contributor.author Autrata, Rudolf
dc.relation.ispartof Microscopy and Microanalysis
dc.identifier.issn 1431-9276 OCLC, Ulrich, Sherpa/RoMEO, JCR
dc.date.issued 2003
utb.relation.volume 9
utb.relation.issue SUPPL. 3
dc.citation.spage 156
dc.citation.epage 157
dc.event.title VIIth InterAmerican Congress on Electron Microscopy, 2003
dc.event.location San Antonio, TX
utb.event.state-en United States
utb.event.state-cs Spojené státy americké
dc.event.sdate 2003-08-03
dc.event.edate 2003-08-07
dc.type conferenceObject
dc.language.iso en
dc.relation.uri http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=173765&fileId=S1431927603016180
utb.faculty Faculty of Technology
dc.identifier.uri http://hdl.handle.net/10563/1005084
utb.identifier.rivid RIV/61389013:_____/03:12030027!RIV/2004/GA0/A55004/N
utb.identifier.obdid 11553054
utb.identifier.scopus 2-s2.0-0142123038
utb.identifier.coden MIMIF
utb.source d-scopus
dc.date.accessioned 2015-06-04T12:56:57Z
dc.date.available 2015-06-04T12:56:57Z
utb.contributor.internalauthor Schauer, František
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