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Browsing Fakulta aplikované informatiky by Author "Fejfar, Antonín"

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Nanoscale characterization of ultra-thin tungsten films deposited by radio-frequency magnetron sputtering

Martínek, Tomáš; Kudělka, Josef; Navrátil, Milan; Křesálek, Vojtěch; Fejfar, Antonín; Hývl, Matěj; Sobota, Jaroslav (Institute of Electrical and Electronics Engineers (IEEE), 2015)

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